- The musical segments are fun and entertaining, and Sia's directing overall is pretty solid for a feature-film directorial debut, but OOOOOFF that script really brings everything and everyone else involved down Pearl Harbor-style. The rest of this log is directly addressing Sia as an artist/creative/fellow human person: Dear Sia, I really hope that this message gets through to you as loudly.
- SCI's Film Wizard TM Professional is the most powerful, versatile, and user friendly software package ever to be offered to the thin film engineer/scientist. It combines optimization and synthesis design capabilities with powerful analytical tools for interpreting spectroscopic and ellipsometric data, modeling of film layers, and performing regressions to determine actual.
SCI's Film WizardTM Professional is the most powerful, versatile, and user friendly software package ever to be offered to the thin film engineer/scientist. It combines optimization and synthesis design capabilities with powerful analytical tools for interpreting spectroscopic and ellipsometric data, modeling of film layers, and performing regressions to determine actual thicknesses and indices of deposited layers. In particular, Film WizardTM:
System Requirements
Microsoft Windows 2000, XP, Vista, Window 7 operating system.
The Wizard of Oz is a 1939 American musical fantasy film produced by Metro-Goldwyn-Mayer.Often seen as one of the greatest films of all time, it is the most commercially successful adaptation of L. Frank Baum's 1900 children's fantasy novel The Wonderful Wizard of Oz. Directed primarily by Victor Fleming (who left the production to take over the troubled Gone with the Wind), the film stars.
Cast Of The Wizard
| Incorporates five new optical thin film synthesis methods including Needle Synthesis. |
| Provides seven optimization algorithms, three of which are global. |
| Provides a constrained optimization option where the user may input maximum and minimum bounds for any variable that is optimized. |
| Computes and optimizes transmittance, reflectance, absorbtance, transmitted phase, reflected phase, ellipsometric parameters (tan(y), cos(D), y, D), optical density, user defined targets (e.g., Ts/Rp - Rs/Tp), electric field, and color coordinate targets. |
| Incorporates several unique material/layer models (Rugate, EMA, Graded, User Defined Index, and Super Lattices) which give the thin film designer more power and flexibility to determine solutions of complex design and material characterization problems. |
| Provides excellent 2D, contour, and 3D graphics. |
| Incorporates a VB style Macro Language. |
| Includes on-line help. |